Capable  of  testing various power semiconductor devices such as IGBTs and SiCs

Automatically complete dynamic performance test of power semiconductor devices and  generate test reports in formats such as .doc, .pdf, .xls and .ppt

Including single-pulse, double-pulse, multi-pulse and other excitation patterns, with both duty cycle and frequency adjustable

High-quality key component

Adjustable over-voltage and over-current thresholds for different power devices, to promptly protect the DUTs

Tests the dynamic characteristics of power semiconductor devices under high temperatures

Specially designed fixture for connecting power semiconductor devices and external drive circuitry ensures convenient installation and disassembly

Insulated anti-explosion test chamber withstanding high-temperature and high-voltage, the intelligent discharge function is integrated to effectively protect personals

Touch screen control that allows fast and convenient operations

The built-in database of power semiconductor devices contains datasheets of popular power semiconductor devices to facilitate test and benchmarking